NC-AFM 2026 starts next week—meet us in Innsbruck!
We are excited to take part in the 27th International Conference on Non-Contact Atomic Force Microscopy, taking place from 3–7 August 2026.
Discover how our technology for mass-selected ion deposition—Controlled Ion-Beam Deposition, or CIBD—can support your nc-AFM, nanoscience and surface-physics experiments.
Prepare well-defined samples or decorate your SPM probe with organic molecules of your choice:
✅ fragile or robust
✅ small or large
✅ single objects or complete layers
✅ deposited with exceptional precision and purity
We offer complete integrated systems as well as modular electronic and ion-optical components for upgrading existing experimental setups.
Let’s meet in Innsbruck and talk about your science and the possibilities for your next experiment!